A technical paper titled “AutoCRAFT: Layout Automation for Custom Circuits in Advanced FinFET Technologies” was published by researchers at UT Austin and NVIDIA. “This paper presents AutoCRAFT, an ...
Abstract: This work presents a comprehensive investigation into the reliability degradation behaviors of n-type fin field effect transistor (N-FinFET) devices under alternating current (ac) stress ...
Abstract: Transistor characteristics in advanced technology nodes are strongly impacted by devices design and process integration choices. Variation in the layout and pattern configuration in close ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback