Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...

MILPITAS, Calif., June 22, 2021 /PRNewswire/ -- Today, KLA Corporation (NASDAQ: KLAC) announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

KLA Corporation KLAC recently launched four new products for the automotive chip manufacturing. The products comprise 8935 high productivity patterned wafer inspection system, the C205 broadband ...

November 24, 2013. Rudolph Technologies has announced that it has won orders for its AWX FSI unpatterned wafer inspection system at both a major Southeast Asia-based outsourced assembly and test (OSAT ...

LONDON--(BUSINESS WIRE)--Technavio analysts forecast the global wafer inspection equipment market to post a CAGR of over 11% by 2019, according to their latest report. The research study covers the ...