Semiconductor Engineering

Enhancing Test Socket Performance Through Application-Specific Validation And System-Level Per-Pin OQC

As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin ...
Business Insider

Advantest Expands 7038 System-Level Test Platform with Right-Sized Single Test Rack Solution for High-Volume Manufacturing

TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Semiconductor Engineering

Case Study: Production Yield And Throughput Improvement Using The Known Good Socket Analysis

The test sockets, which are crucial components that directly interface with semiconductor IC packages, have a profound impact on device testing performance. Pins with high CRES not only cause false ...
Nasdaq

Advantest Expands 7038 System-Level Test Platform with Right-Sized Single Test Rack Solution for High-Volume Manufacturing

New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...