A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...

When we talk about defects, we generally think of flaws or impairments. However, as far as materials science is concerned, defects represent windows of opportunity. A new Collaborative Research Center ...

(Nanowerk News) Monolayer crystals, often being referred as 2D crystals or 2D materials, possess the unique characteristic of having a single layer of regular atomic structure. And the more regular ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...