A new technical paper titled “Cryogenic-Aware Forward Body Biasing in Bulk CMOS” was published by researchers at QuTech, Tu Delft. “Cryogenic CMOS (cryo-CMOS) circuits are often hindered by the ...

Bias temperature instability (BTI) remains a critical reliability concern in modern CMOS technology. This phenomenon, which encompasses both negative (NBTI) and positive (PBTI) bias-driven degradation ...

With RS-485 networks, there are periods of time when no driver is actively driving the bus, such as when one driver relinquishes the bus to another driver. During this time, the termination resistors ...

Despite recent improvements in the performance of RF LDMOS field-effect transistors (FETs), temperature drift and aging continue to affect the efficiency and linearization of power amplifiers using ...